https://rmf.smf.mx/ojs/index.php/rmf-s <p><em><strong>Suplemento de la Revista Mexicana de Física</strong></em> (formerly Revista Mexicana de Física S). As of 2019, it is not anymore linked to Revista Mexicana de Física and instead it is an independent online journal, published by Socie­dad Mexicana de Física, A.C. It publishes peer reviewed self-contained volumes on subjects in Physics and related areas as well as selected papers of scientific events in Physics and related areas. Because of its nature, it is a non-periodical journal. It is not yet an indexed publication.</p> <p><strong>General information to send articles to the Special Issues that are <a href="https://rmf.smf.mx/ojs/index.php/rmf-s/announcement">announced</a> in the <em>Suplemento de la Revista Mexicana de Física</em>.</strong></p> <p>To submit an article to Suplemento de la Revista Mexicana de Física <a href="https://rmf.smf.mx/ojs/index.php/rmf-s/user/register">register</a> as an author and upload your work. A LaTeX template can be found in the <a href="https://rmf.smf.mx/ojs/index.php/rmf-s/about/submissions">author's guidelines</a>. However, initially it is only required that authors submit a pdf file to start the evaluation process. Although there is no limit for the number of pages, it is suggested that papers have an extension between 4 and 8 pages under the journal format. Authors can check as an example the <a href="https://rmf.smf.mx/ojs/index.php/rmf-s/issue/view/396">recently published works</a>.</p> <p>The <a href="https://rmf.smf.mx/ojs/index.php/rmf-s/about">review process</a> is the same as the one for works received in Revista Mexicana de Física and Revista Mexicana de Física E.</p> Sociedad Mexicana de Física en-US Suplemento de la Revista Mexicana de Física 2683-2585 <p>Authors retain copyright and grant the <strong><em>Suplemento de la Revista Mexicana de Física</em></strong> right of first publication with the work simultaneously licensed under a CC BY-NC-ND 4.0 that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this journal.</p> https://rmf.smf.mx/ojs/index.php/rmf-s/article/view/7441 <p>Atomic force microscopy (AFM) is a well-established technique for studying materials at nanoscale dimensions. The resolution of this instrument strongly relies on the sharpness of its tip, which can become compromised through wear and breakage, often due to contamination at the AFM tip apex. To evaluate the condition of both new and used tips, scanning electron microscopy (SEM) inspection is commonly employed. However, SEM services may not always be readily available or in high demand. In this study, we present an AFM tip calibration device that utilizes a pattern of etched tracks on CR-39 material. To construct this device, you will require a radioactive alpha particle source, typically Americium-241, as well as a controlled temperature bath set at 60 degrees Celsius, which contains a 6.25 M KOH solution. This endeavor serves as another intriguing and practical application of the nuclear tracks methodology.</p> B. E. Zendejas-Leal R. Fragoso-Soriano Carlos Vázquez López E. López-Cruz Copyright (c) 2024 B. E. Zendejas-Leal, R. Fragoso-Soriano, Carlos Vázquez López, E. López-Cruz https://creativecommons.org/licenses/by-nc-nd/4.0 2024-08-06 2024-08-06 5 1 011201 1–3 011201 1–3 10.31349/SuplRevMexFis.5.011201