Siqueiros, J., Machorro, R., Shu Wang., Talavera, L., Portelles, J., . and Villa, F. (1999) “Optical characterization of thin and ultrathin chromium films”, Revista Mexicana de Física, 45(6), pp. 593–596. Available at: https://rmf.smf.mx/ojs/index.php/rmf/article/view/2913 (Accessed: 5 July 2024).