E, B., C, M., a Sánchez., A, J. and noso Hernández. (2013) “Common-source cold-FET used to validate noise figure measurements and on-wafer FET noise parameters”, Revista Mexicana de Física, 59(6 Nov-Dec), pp. 560–0. Available at: https://rmf.smf.mx/ojs/index.php/rmf/article/view/4038 (Accessed: 5 July 2024).