Pe, P., kov., T. Díaz, ., and H. Juárez. “Investigation of Metal Oxide Semiconductor Structures Containing Discrete Interface Traps”. Revista Mexicana De Física, vol. 41, no. 4, Jan. 1994, pp. 579-85, https://rmf.smf.mx/ojs/index.php/rmf/article/view/2514.