Application of the total internal reflection phenomenon as a gas sensing technique using evaporated SnO$_{2}$ thin films

L. Martínez Pérez, V. Altuzar, N. Muñoz Aguirre, V. Gariba, -Febles. , M. Lozada-Cassou, M. Aguilar-Frutis, O. Zela, a-Angel.


In this work it is shown that the Total Internal Reflection (TIR) phenomenon can be exploited for gas detection. Total internal reflectance measurements for evaporated SnO$_{2}$ thin films on quartz substrates are measured at ambient conditions. Changes in the reflectance measurements are measured when CO$_{2}$ or N$_{2}$ gas flows on the surface of the SnO$_{2}$ films. The observed shift in the measured reflectance is defined as the signal of the sensor. Preliminary results show that the maximum response takes place at incident angles close to the critical angle of the quartz-air system.


Total Internal Reflection; Optical gas sensors; Tin dioxide thin films; anisotropic materials;, CO detection

Full Text:



  • There are currently no refbacks.

Revista Mexicana de Física

ISSN: 2683-2224 (on line), 0035-001X (print)

Bimonthly publication of Sociedad Mexicana de Física, A.C.
Departamento de Física, 2o. Piso, Facultad de Ciencias, UNAM.
Circuito Exterior s/n, Ciudad Universitaria. C. P. 04510 Ciudad de México.
Apartado Postal 70-348, Coyoacán, 04511 Ciudad de México.
Tel/Fax: (52) 55-5622-4946, (52) 55-5622-4840.