Caracterización de componentes fotónicos utilizando reflectometría óptica de baja coherencia*

C. Palavicini, Y. Jaouën, P. Gallion, G. Campuzano

Abstract


Optical low-coherence reflectometry has been succesfully applied to the characterization of photonic devices. This non-destructive and versatile technique permits the detection, localization and quantification of scattering discontinuities of optoelectronic devices, yielding an accurate and direct information of the optical properties of the device.

Keywords


Optical low-coherence reflectometry; photonic device characterization

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Revista Mexicana de Física

ISSN: 2683-2224 (on line), 0035-001X (print)

Bimonthly publication of Sociedad Mexicana de Física, A.C.
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