Optical sensing technique for Young's modulus measurements in piezoelectric materials

S.J. Pérez Ruíz, J.A. Montero Díaz, S. Alcántara Iniesta, P.R. Hernández, R. Castañeda G.


In the design of microsensors using microelectromechanical system (MEMS) technology, it is necessary to know the elastic properties of the materials employed in their fabrication. Reliable mechanical properties of the materials are critical to the safety and correct functioning of these microdevices. Mechanical testing of microstructures that are only a few microns thick requires novel techniques and specialized procedures for preparation and handling. In this paper a simplified optic sensing is used to measure the Young's modulus in piezoelectric cantilever. This optical technique was chosen because it is the most appropriate when working with small devices, besides being easily implemented and low cost.


Young's Modulus; piezoelectric cantilever

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REVISTA MEXICANA DE FÍSICA, year 67, issue 2, March-April 2021. Bimonthly Journal published by Sociedad Mexicana de Física, A. C. Departamento de Física, 2º Piso, Facultad de Ciencias, Universidad Nacional Autónoma de México, Ciudad Universitaria, Alcaldía Coyacán, C.P. 04510 , Ciudad de México. Apartado Postal 70-348. Tel. (+52)55-5622-4946, https://rmf.smf.mx/ojs/rmf, e-mail: rmf@ciencias.unam.mx. Chief Editor: José Alejandro Ayala Mercado. INDAUTOR Certificate of Reserve: 04-2019-080216404400-203, ISSN: 2683-2224 (on line), 0035-001X (print), both granted by Instituto Nacional del Derecho de Autor. Responsible for the last update of this issue, Technical Staff of Sociedad Mexicana de Física, A. C., Fís. Efraín Garrido Román, 2º. Piso, Facultad de Ciencias, Universidad Nacional Autónoma de México, Ciudad Universitaria, Alcaldía Coyacán, C.P. 04510 , Ciudad de México. Date of last modification, March 1st., 2021.

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