A program for phase identification using diffractograms obtained from TEM structure images

R. Galicia, R. Herrera, J. L, C. Zorrilla, A. Gómez

Abstract


In this work a computer program for the indexing of diffractograms is presented. The diffractograms are obtained by means of a discrete Fourier transform from high resolution electron microscope images. The program requires the use of x-ray diffraction data files together with a fast Fourier transform program, for this purpose we used the Digital Micrograph software.

Keywords


Electron microscopy; X-ray diffraction; difractograms; indexing

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Revista Mexicana de Física

ISSN: 2683-2224 (on line), 0035-001X (print)

Bimonthly publication of Sociedad Mexicana de Física, A.C.
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