Graphite thin film characterization using a simplified resonant near field scanning microwave microscope

G. López-Maldonado, N. Qureshi, O. V, H. Vargas-Hernández, C. L

Abstract


We describe a highly simplified design for a coaxial resonant near field scanning microwave microscope operating at 7.4 GHz configured to measure surface resistance and obtain topographic images with micrometer resolution. This design for a resonant probe tip combined with a highly stable mechanical system developed to rapidly tune the resonant frequency enables a simplified and effective approach to implementing near field microwave microscopy. We present images and measurements performed on a non-uniform granular graphite film sample and the surface resistance results agree with data in the literature.

Keywords


Near field scanning microwave microscopy; surface resistance; topographic images; resonant probe; resonant frequency

Full Text:

PDF

Refbacks

  • There are currently no refbacks.


Revista Mexicana de Física

ISSN: 2683-2224 (on line), 0035-001X (print)

Bimonthly publication of Sociedad Mexicana de Física, A.C.
Departamento de Física, 2o. Piso, Facultad de Ciencias, UNAM.
Circuito Exterior s/n, Ciudad Universitaria. C. P. 04510 Ciudad de México.
Apartado Postal 70-348, Coyoacán, 04511 Ciudad de México.
Tel/Fax: (52) 55-5622-4946, (52) 55-5622-4840. rmf@ciencias.unam.mx