Graphite thin film characterization using a simplified resonant near field scanning microwave microscope

G. López-Maldonado, N. Qureshi, O. V, H. Vargas-Hernández, C. L


We describe a highly simplified design for a coaxial resonant near field scanning microwave microscope operating at 7.4 GHz configured to measure surface resistance and obtain topographic images with micrometer resolution. This design for a resonant probe tip combined with a highly stable mechanical system developed to rapidly tune the resonant frequency enables a simplified and effective approach to implementing near field microwave microscopy. We present images and measurements performed on a non-uniform granular graphite film sample and the surface resistance results agree with data in the literature.


Near field scanning microwave microscopy; surface resistance; topographic images; resonant probe; resonant frequency

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Revista Mexicana de Física

ISSN: 2683-2224 (on line), 0035-001X (print)

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