A method to obtain orientation curves in Euler space for a seccond diffraction process in polycrystals

Jesús Palacios Gómez, R.S. Salat Figols, T. Kryshtab


A method is presented to obtain the orientation curve in the Eulerian space, of crystallites which diffract in one point of a Debye-Scherer ring in a second diffraction process. The incident beam is therefore the reflected beam of a previous diffraction process, and the sample has a general orientation for a pole figure measurement, given as usual by two angles, χ  around the sample Y axis, and φ around the sample normal. Two solutions are found for all secondary reflections. The method proposed here was outlined somewhere else for the measurement of pole figures by neutron diffraction [1], and here important improvements are made, especially regarding the mathematical methods.


X-ray diffraction; Texture; Extinction

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DOI: https://doi.org/10.31349/RevMexFis.64.375


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Revista Mexicana de Física

ISSN: 2683-2224 (on line), 0035-001X (print)

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