Application of the nuclear tracks methodology for the validation of atomic force microscope probe tips

Abstract

Atomic force microscopy (AFM) is a well-established technique for studying materials at nanoscale dimensions. The resolution of this instrument strongly relies on the sharpness of its tip, which can become compromised through wear and breakage, often due to contamination at the AFM tip apex. To evaluate the condition of both new and used tips, scanning electron microscopy (SEM) inspection is commonly employed. However, SEM services may not always be readily available or in high demand. In this study, we present an AFM tip calibration device that utilizes a pattern of etched tracks on CR-39 material. To construct this device, you will require a radioactive alpha particle source, typically Americium-241, as well as a controlled temperature bath set at 60 degrees Celsius, which contains a 6.25 M KOH solution. This endeavor serves as another intriguing and practical application of the nuclear tracks methodology.