Application of the total internal reflection phenomenon as a gas sensing technique using evaporated SnO$_{2}$ thin films

Authors

  • L. Martínez Pérez
  • V. Altuzar
  • N. Muñoz Aguirre
  • V. Gariba
  • -Febles.
  • M. Lozada-Cassou
  • M. Aguilar-Frutis
  • O. Zela
  • a-Angel.

Keywords:

Total Internal Reflection, Optical gas sensors, Tin dioxide thin films, anisotropic materials, , CO detection

Abstract

In this work it is shown that the Total Internal Reflection (TIR) phenomenon can be exploited for gas detection. Total internal reflectance measurements for evaporated SnO$_{2}$ thin films on quartz substrates are measured at ambient conditions. Changes in the reflectance measurements are measured when CO$_{2}$ or N$_{2}$ gas flows on the surface of the SnO$_{2}$ films. The observed shift in the measured reflectance is defined as the signal of the sensor. Preliminary results show that the maximum response takes place at incident angles close to the critical angle of the quartz-air system.

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Published

2004-01-01

How to Cite

[1]
L. Martínez Pérez, “Application of the total internal reflection phenomenon as a gas sensing technique using evaporated SnO$_{2}$ thin films”, Rev. Mex. Fís., vol. 50, no. 5, pp. 518–0, Jan. 2004.

Issue

Vol. 50 No. 5 (2004): Revista Mexicana de Física.

Section

Articles

License

Authors retain copyright and grant the Revista Mexicana de Física right of first publication with the work simultaneously licensed under a CC BY-NC-ND 4.0 that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this journal.