Análisis de tensión/tamaño en compuestos ternarios AgIn$_5$VI$_8$ (VI = S, Se, Te) mediante difracción de Rayos-x

Authors

  • J.R. Fermina
  • D.Y. Salcedo
  • C. Durante Rincóna
  • J.A. Castro

Keywords:

Strain/size analysis, Scherrer modified equation, microstructural properties, ternary compounds AgInVI

Abstract

In this work, we have study the microestructural properties of the ternary compounds AgIn$_5$VI$_8$ (VI= S, Se, Te) by X-ray diffraction technique (XRD). The linewidth of the XRD profile is measured as function of the diffraction angle. Structural parameters such as, average grain size, microstrains, and crystalline dislocation density, are obtained on the framework of a strain/size analysis based on the modified Scherrer equation for Gaussian profiles. The crystalline dislocations arrange according to a Gaussian distribution function, indicating that these dislocations are randomly distributed within the grains.

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Published

2017-01-01

How to Cite

[1]
J. Fermina, D. Salcedo, C. Durante Rincóna, and J. Castro, “Análisis de tensión/tamaño en compuestos ternarios AgIn$_5$VI$_8$ (VI = S, Se, Te) mediante difracción de Rayos-x”, Rev. Mex. Fís., vol. 63, no. 4 Jul-Aug, pp. 345–0, Jan. 2017.

Issue

Vol. 63 No. 4 Jul-Aug (2017): Revista Mexicana de Física

Section

Articles

License

Authors retain copyright and grant the Revista Mexicana de Física right of first publication with the work simultaneously licensed under a CC BY-NC-ND 4.0 that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this journal.