Structural, optical and electrical properties of CdS thin films obtained by spray pyrolysis

Authors

  • C. Santiago Tepantlán
  • A.M. Pérez González
  • I. Valeriano Arreola

Keywords:

CdS thin films, spray pyrolysis, structural properties, optical properties, electrical properties

Abstract

Cadmium sulphide (CdS) thin films were prepared by means of the chemical spray pyrolysis technique. The substrate temperature was varied in the range from 200 to 400$^{\circ}$C. The structural properties of the semiconductor were characterized by X-ray diffraction; XRD patterns indicated the presence of single-phase hexagonal CdS. Direct band gap values of 2.37-2.41 eV were obtained. The refractive index is reported on depending on the substrate temperature, and was obtained from transmission spectra and from spectroellipsometry measurements. As a consequence, the optical parameters of the films were determined using the Swanepoel, Cauchy, Sellmeier and Wemple models. The resistivity of the films was found to vary in the range 10$^{3}-$10$^{5} \Omega $.cm, depending on the substrate temperature.

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Published

2008-01-01

How to Cite

[1]
C. Santiago Tepantlán, A. Pérez González, and I. Valeriano Arreola, “Structural, optical and electrical properties of CdS thin films obtained by spray pyrolysis”, Rev. Mex. Fís., vol. 54, no. 2, pp. 112–0, Jan. 2008.

Issue

Vol. 54 No. 2 (2008): Revista Mexicana de Física.

Section

Articles

License

Authors retain copyright and grant the Revista Mexicana de Física right of first publication with the work simultaneously licensed under a CC BY-NC-ND 4.0 that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this journal.