Common-source cold-FET used to validate noise figure measurements and on-wafer FET noise parameters
DOI:
https://doi.org/10.31349/RevMexFis.59.6.560Keywords:
Noise figure, noise parameters, cold-FET, source-pull tuner method, F 50 methodAbstract
This work proposes the use of a common-source cold-FET with gate forward biased to validate the noise figure measurements and the noise parameters of on-wafer transistors. Since a common-source cold-FET behaves as an attenuator, its noise figure and noise parameters can be determined from S-parameters measurements. Three methods for determining the noise parameters of the common-source cold-FET are investigated. The first one uses the noise correlation matrix for passive devices (the S-parameters), the second one is the tuner method and the third one is the F$_{50}$ method. The noise figure measured and the noise figure computed from S-parameters agree quite well. The noise parameters extracted with the tuner method and the F$_{50}$ method show good correlation with the noise parameters computed with the S-parameters. These results validate both the noise figure measurements and the noise parameters extraction.Downloads
References
F. Daneville, IEEE Microwave Magazine 11 (2010) 53-59 DOI: https://doi.org/10.1109/MMM.2010.937731
M.W. Pospieszalski, IEEE Microwave Magazine, 11 (2010) 61-69 DOI: https://doi.org/10.1109/MMM.2010.937733
IRE Subcommittee on Noise, Proc. IRE 48 (1960) 60-68 DOI: https://doi.org/10.1109/JRPROC.1960.287380
R. Q. Lane, Proc. IEEE 57 (1969) 1461-1462 DOI: https://doi.org/10.1109/PROC.1969.7311
M. Mitama, and H. Katoh, IEEE Trans. Microwave Theory Tech. 27 (1979) 612-615 DOI: https://doi.org/10.1109/TMTT.1979.1129680
J. M. O’Callaghan and J. P. Mondal, IEEE Trans. Microwave Theory Tech. 39 (1991) 1376-1382 DOI: https://doi.org/10.1109/22.85413
G. Vasilescu, G. Alquie, and M. Krim, Electron. Letters 25 (1989) 292-293 DOI: https://doi.org/10.1049/el:19890203
A. Boudiaf, M. Laporte, J. Danglaand, G. Vernet. IEEE MTT-SInt. Microwave Symp. Dig. (1992) 1569-1572
P. J. Tasker, W. Reinert, B. Hughes, J. Braunstein, and M.Schlechtweg, IEEE MTT-S Digest (1993) 1251-1254 DOI: https://doi.org/10.1109/MWSYM.1993.277100
A. Lazaro, L. Pradell and J. O’Callaghan, IEEE Trans. Microwave Theory and Tech. 47 (1999) 315-324 DOI: https://doi.org/10.1109/22.750233
L. Escotte, R. Olana, J. Rayssac, O. Llopis, and J. Graffeuil,Electron. Letters 27 (1991) 833-835 DOI: https://doi.org/10.1049/el:19910522
L. Escotte, R. Plana, and J. Graffeuil, IEEE Trans. Microwave Theory and Tech. 41 (1993) 382-387 DOI: https://doi.org/10.1109/22.223735
M. C. Maya, A. Lazaro, L. Pradell, “Cold-FET ENR character-isation applied to the measurement of on-wafer transistor noiseparameters”, (32ndEuropean EUMC Microwave Conference,2002) pp. 41-44 DOI: https://doi.org/10.1109/EUMA.2002.339216
M. C. Maya, A. Lazaro, L. Pradell, Microwave and Optical Technology Letters, 40 (2004) 326–330 DOI: https://doi.org/10.1002/mop.11370
R. Pettai, “Noise in receiving systems”, (John Wiley and Sons, Inc. 1984). pp. 273
H. Hillbrand, and P. H. Russer, IEEE Trans. Circuits and Systems, CAS-23 (1976), pp. 235-238 DOI: https://doi.org/10.1109/TCS.1976.1084200
J. A. Dobrowolsky, “Introduction to Computer Methods for Microwave Circuit Analysis and Design”, (Artech House, Inc. 1stEdition, Boston, 1991) pp. 423
J. A. Reynoso-Hernandez, F.E. Rangel-Patiño, and J. Perdomo, IEEE Trans. Microwave Theory Tech. 44 (1996) 2625-2633 DOI: https://doi.org/10.1109/22.554613
A. Lazaro, M.C. Maya, and L. Pradell, Microwave Journal 45 (2002) 20-46
G. Dambrine, A. Cappy, F. Heliodore, and E. Playez, IEEE Trans. Microwave Theory and Tech., 36 (1988) 1151-1159 DOI: https://doi.org/10.1109/22.3650
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