Automatización de un microscopio de barrido por efecto túnel utilizando una tarjeta OMB-DaqBoard/2000 y LabVIEW

Authors

  • J.A. Martínez
  • J. Valenzuela M.P
  • J. Herrera

Keywords:

Scanning tunneling microscopy, microscopy instrumentation, data acquisition

Abstract

This paper shows the work for the automation and control of a scanning tunneling microscope (STM) built by the authors. The interface between the computer and the microscope has been implemented by mean of the data acquisition board OMB-DaqBoard/2000. A developed software in LabVIEW generates the signals required for the X-Y scanning, and it simultaneously acquires the Z voltages, related to the tunneling current between the tip and the sample. The program constructs the microscopy images of the studied surface from the Z voltages. The process to calibrate the instrument using atomic resolution images of known samples is also presented.

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Published

2016-01-01

How to Cite

[1]
J. Martínez, J. Valenzuela M.P, and J. Herrera, “Automatización de un microscopio de barrido por efecto túnel utilizando una tarjeta OMB-DaqBoard/2000 y LabVIEW”, Rev. Mex. Fís., vol. 62, no. 1 Jan-Feb, pp. 45–0, Jan. 2016.

Issue

Vol. 62 No. 1 Jan-Feb (2016): Revista Mexicana de Física.

Section

Articles

License

Authors retain copyright and grant the Revista Mexicana de Física right of first publication with the work simultaneously licensed under a CC BY-NC-ND 4.0 that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this journal.