Aberration patterns in the optical testing surfaces using transport of intensity equation
DOI:
https://doi.org/10.31349/RevMexFis.68.011301Keywords:
Optical Testing, TIE, WavefrontAbstract
Classic phase retrieval techniques use intensity patterns to obtain typical aberrations such as coma or astigmatism. However, the patterns obtained with the Transport of Intensity Equation techniques have not been studied yet. In this work, we propose a method to obtain intensity distributions of some aberration wavefronts. It is expected that this characterization method may facilitate new testing strategies in optical workshops.
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Copyright (c) 2021 Angel Eugenio Martinez Rodriguez, Manuel Campos García, F. S. Granados Agustín, C. Vargas-Alfredo
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