Amplitude and phase measument using reflection polarization mode of a prism-based surface plasmon resonance
DOI:
https://doi.org/10.31349/RevMexFis.68.031304Keywords:
Surface plasmon, Polarization, Ellipsometry, Film thicknessAbstract
In this paper, the amplitude and phase characteristics of internal reflection of gold nanofilms are investigated using polarization modulation of electromagnetic radiation in the Kretschmann geometry, an excited wavelength of the SPR at 633 nm is considered. The numerical results that are presented in this work are based on the substrate, the variation of the thickness of the dielectric and the type of plasmonic material using gold (Ag), through the ellipsometry parameters Ψ and ∆.
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Copyright (c) 2022 Hector Hugo Sánchez Hernández, Juan Manuel Peréz-Abarca, Agustín Santiago Alvarado, A. Sinue Cruz-Felix
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