Amplitude and phase measument using reflection polarization mode of a prism-based surface plasmon resonance

Authors

  • Hector Hugo Sánchez Hernández Optica
  • Juan Manuel Peréz-Abarca Universidad del Papaloapan
  • Agustín Santiago Alvarado Universidad Tecnológica de la Mixteca
  • A. Sinue Cruz-Felix Universidad Tecnologica de la Mixteca

DOI:

https://doi.org/10.31349/RevMexFis.68.031304

Keywords:

Surface plasmon, Polarization, Ellipsometry, Film thickness

Abstract

In this paper, the amplitude and phase characteristics of internal reflection of gold nanofilms are investigated using polarization modulation of electromagnetic radiation in the Kretschmann geometry, an excited wavelength of the SPR at 633 nm is considered. The numerical results that are presented in this work are based on the substrate, the variation of the thickness of the dielectric and the type of plasmonic material using gold (Ag), through the ellipsometry parameters Ψ and ∆.

Author Biographies

Juan Manuel Peréz-Abarca, Universidad del Papaloapan

Profesor- Investigador

Agustín Santiago Alvarado, Universidad Tecnológica de la Mixteca

Profesor-Investigador

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Published

2022-05-01

How to Cite

Sánchez Hernández, Hector Hugo, Juan Manuel Peréz-Abarca, Agustín Santiago Alvarado, and A. Sinue Cruz-Felix. 2022. “Amplitude and Phase Measument Using Reflection Polarization Mode of a Prism-Based Surface Plasmon Resonance”. Revista Mexicana De Física 68 (3 May-Jun):031304 1-0. https://doi.org/10.31349/RevMexFis.68.031304.