Study by transmition electron microscopy of Co-WC/Ni interface produced by solid state bonding
DOI:
https://doi.org/10.31349/RevMexFis.70.051601Keywords:
WC-Co/Ni interface; solid state bonding; diffusion; characteristic energy-dispersive x-ray spectroscopy; electron microscopyAbstract
The microstructure of the interface and inter-diffusion behavior during bonding plays an important role to understand and to control the joining process for better mechanical properties of an interface. In this work, the microstructure of the formed interlayer between cermet WC-Co and metallic Ni after solid state bonding (the WC-Co/Ni interface) was analyzed by scanning (SEM) and transmission (TEM) electron microscopy, and characteristic energy dispersive x-ray spectroscopy (EDS). The WC-Co/Ni joint was produced at 980°C for 25 minutes in argon atmosphere. For SEM observation, the samples were mechanically polished and etched. TEM samples were produced parallel (sample P), perpendicular (sample T) and oblique (sample TP) to the interface by focused ion beam (FIB). The EDS results indicate the inter-diffusion at the interface of W, Ni, Co and C and the segregation of Ni and Co, together with the formation of crystalline phases and an amorphous carbon layer. W follows a homogeneous diffusion while Ni and Co show a non-homogeneous diffusion behavior.
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Copyright (c) 2024 José Lemus-Ruiz, G. Castro-Sánchez, J. Reyes-Gasga, R. García-García, J. L. Marulanda-Arevalo, L. Ortega-Cabello
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