A scientific journal publishing original research and reviews across all areas of physics, serving the international physics community.
Editor-in-chief: Ramón Castañeda Priego
Frequency: Bimonthly
Publisher: Sociedad Mexicana de Física
In this work are presented the results obtained from the deposition of Cd1-xZnxTe nanolayers using as precursor the vapours of the elements Zn, Te, and a mixture of Cd and Zn on GaAs and GaSb (001) substrates by Atomic Layer Deposition technique (ALD), which allows the deposition of layers of nanometric dimensions. At each exposure of the growth surface to the of cation or anion precursors vapours, this surface is saturated. Therefore, it is considered that the process is self-regulated. The ZnTe layers were grown in a wide range of temperatures; however, ZnTe nanolayers with a shiny mirror-like surface could be grown at temperatures between 370 and 410oC. Temperatures higher than 400oC were necessary for the CdTe growth. The layers of the Cd1-xZnxTe ternary alloy were deposited at temperature range of 400 and 425oC. The grown nanofilms were characterized by Raman spectroscopy and high-resolution X-ray diffraction. The Raman spectrum shows the peak corresponding to LO-ZnTe at 208 cm-1, which is weak and is slightly redshifted in comparison with the reported for the bulk ZnTe. For the case of the CdTe nanolayers, Raman spectrum presents the LO-CdTe peak, which is indicative of the successfully growth of the nanolayers, its weakness and its slight redshifted in comparison with the reported for the bulk CdTe can be related with the nanometric characteristic of this layer. The performed high resolution X-ray diffraction measurements allowed to study some important characteristics, as the crystallinity of the grown layers. Additionally, the performed HR-XRD measurements suggest that the crystalline quality have dependence with the growth temperature.
The quaternary chalcogenide compound Ag2MnSnS4 belonging to the system I2-II-IV-VI4 and synthesized by the melt and anneal technique, was characterized by Rietveld refinement of the powder X-ray diffraction data and differential thermal analysis (DTA). It was found that nS4 crystallizes in the orthorhombic space group Pmn21, with unit cell parameters a = 8:1705(5) Å, b = 6:9413(5) Å, c = 6:6532(5) Å, and V = 377:33(5) Å3, in a wurtzite-stannite structure. The DTA indicates that this compound melts at 790°C and that the phase relations which occurs in the material would be: α ➝ α + α1 ➝ α1 ➝ α1 + β ➝ β ➝ 1 + L ➝ L, were α is the orthorhombic wurtzite-stannite Pmn21 structure; α1 is a high temperature modification; and β and β1 are the zinc-blende structure and its high-temperature modification, respectively.
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REVISTA MEXICANA DE FÍSICA, year 72, issue 2, March-April 2026. Bimonthly Journal published by Sociedad Mexicana de Física, A. C. Departamento de Física, 2º Piso, Facultad de Ciencias, Universidad Nacional Autónoma de México, Ciudad Universitaria, Alcaldía Coyacán, C.P. 04510, Ciudad de México. Apartado Postal 70-348. Tels. (+52)55 5622 4946, (+52) 5622 4848, https://rmf.smf.mx/ojs/rmf, e-mail: rmf@ciencias.unam.mx. Chief Editor: Ramón Castañeda Priego. INDAUTOR Certificate of Reserve: 04-2021-102913424600-203, e-ISSN: 2683-2224, granted by Instituto Nacional del Derecho de Autor. Responsible for the last update of this issue, Technical Staff of Sociedad Mexicana de Física, A. C., 2o. Piso, Facultad de Ciencias, Universidad Nacional Autónoma de México, Ciudad Universitaria, C.P. 04510, Coyoacán, CDMX. Date of last modification, March 9, 2026.
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