Near-field microscopy of evanescent microwaves

Authors

  • V. Coello
  • R. Villagómez
  • R. Cortés
  • R. López
  • C. Martínez

Keywords:

Scanning near-field optical microscopy, microwave radiation, wave optics

Abstract

Local control of evanescent microwaves is experimentally investigated using a scanning near-field microwave microscope. The capabilities of the microscope and the contribution, on the near field images, of propagating field components stemming from inelastic (out-of-plane) scattering were elucidated. A set of two-dimensional mirrors for a local control of evanescent modes are shown along with their corresponding near-field image, and their efficiency is discussed. We believe that the experimental approach used is reliable enough to be used as a check of potential (two-dimensional) micro-components and possibly for micro and nano-circuits.

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Published

2005-01-01

How to Cite

[1]
V. Coello, R. Villagómez, R. Cortés, R. López, and C. Martínez, “Near-field microscopy of evanescent microwaves”, Rev. Mex. Fís., vol. 51, no. 4, pp. 426–0, Jan. 2005.

Issue

Vol. 51 No. 4 (2005): Revista Mexicana de Física.

Section

Articles

License

Authors retain copyright and grant the Revista Mexicana de Física right of first publication with the work simultaneously licensed under a CC BY-NC-ND 4.0 that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this journal.