SnO$_{2}$:F thin films deposited by RF magnetron sputtering: effect of the SnF$_{2}$ amount in the target on the physical properties

Authors

  • F. de Moure-Flores
  • A. Guillén-Cervantes
  • K.E. Nieto-Zepeda
  • J.G. Quiñones-Galván
  • A. Hernández-Hernández
  • M. de la L
  • M. Meléndez-Lira

Keywords:

F-doped tin oxide, transparent conducting oxide, RF magnetron sputtering, transparent electrodes

Abstract

SnO$_{2}$:F thin films were prepared by RF magnetron sputtering onto glass substrates using SnF$_{2}$ as fluorine source. The films were deposited under a mixed argon/hydrogen atmosphere at a substrate temperature of 500$^{\circ}$C. The X-ray diffraction shows that polycrystalline films were grown with a phases mixture of SnO$_{2}$ and SnO. The optical transmittance is between 80 and 90%. The physical properties of the films suggest that SnO$_{2}$ thin films grown with small SnF$_{2}$ content in the target can be considered as candidates for transparent electrodes.

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Published

2013-01-01

How to Cite

[1]
F. de Moure-Flores, “SnO$_{2}$:F thin films deposited by RF magnetron sputtering: effect of the SnF$_{2}$ amount in the target on the physical properties”, Rev. Mex. Fís., vol. 59, no. 4, pp. 335–0, Jan. 2013.