Graphite thin film characterization using a simplified resonant near field scanning microwave microscope

Authors

  • G. López-Maldonado
  • N. Qureshi
  • O. V
  • H. Vargas-Hernández
  • C. L

Keywords:

Near field scanning microwave microscopy, surface resistance, topographic images, resonant probe, resonant frequency

Abstract

We describe a highly simplified design for a coaxial resonant near field scanning microwave microscope operating at 7.4 GHz configured to measure surface resistance and obtain topographic images with micrometer resolution. This design for a resonant probe tip combined with a highly stable mechanical system developed to rapidly tune the resonant frequency enables a simplified and effective approach to implementing near field microwave microscopy. We present images and measurements performed on a non-uniform granular graphite film sample and the surface resistance results agree with data in the literature.

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Published

2014-01-01

How to Cite

[1]
G. López-Maldonado, N. Qureshi, O. V, H. Vargas-Hernández, and C. L, “Graphite thin film characterization using a simplified resonant near field scanning microwave microscope”, Rev. Mex. Fís., vol. 60, no. 1 Jan-Feb, pp. 88–0, Jan. 2014.

Issue

Vol. 60 No. 1 Jan-Feb (2014): Revista Mexicana de Física.

Section

Articles

License

Authors retain copyright and grant the Revista Mexicana de Física right of first publication with the work simultaneously licensed under a CC BY-NC-ND 4.0 that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this journal.