Caracterización de componentes fotónicos utilizando reflectometría óptica de baja coherencia*

Authors

  • C. Palavicini
  • Y. Jaouën
  • P. Gallion
  • G. Campuzano

Keywords:

Optical low-coherence reflectometry, photonic device characterization

Abstract

Optical low-coherence reflectometry has been succesfully applied to the characterization of photonic devices. This non-destructive and versatile technique permits the detection, localization and quantification of scattering discontinuities of optoelectronic devices, yielding an accurate and direct information of the optical properties of the device.

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Published

2006-01-01

How to Cite

[1]
C. Palavicini, Y. Jaouën, P. Gallion, and G. Campuzano, “Caracterización de componentes fotónicos utilizando reflectometría óptica de baja coherencia*”, Rev. Mex. Fís., vol. 52, no. 4, pp. 379–0, Jan. 2006.

Issue

Vol. 52 No. 4 (2006): Revista Mexicana de Física.

Section

Articles

License

Authors retain copyright and grant the Revista Mexicana de Física right of first publication with the work simultaneously licensed under a CC BY-NC-ND 4.0 that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this journal.