General method for thickness determination of thin backed films. New formulation of backscattering spectrometry

Authors

  • E.F. Aguilera
  • E. Martínez-Quiroz
  • H.M. Berdejo
  • .
  • M.C. Fernández

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Published

1994-01-01

How to Cite

[1]
E. Aguilera, E. Martínez-Quiroz, H. Berdejo, ., and M. Fernández, “General method for thickness determination of thin backed films. New formulation of backscattering spectrometry”, Rev. Mex. Fís., vol. 41, no. 4, pp. 507–523, Jan. 1994.

Issue

Vol. 41 No. 4 (1994): Revista Mexicana de Física.

Section

Articles

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Authors retain copyright and grant the Revista Mexicana de Física right of first publication with the work simultaneously licensed under a CC BY-NC-ND 4.0 that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this journal.