General method for thickness determination of thin backed films. New formulation of backscattering spectrometry

Authors

  • E.F. Aguilera
  • E. Martínez-Quiroz
  • H.M. Berdejo
  • .
  • M.C. Fernández

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Published

1994-01-01

How to Cite

[1]
E. Aguilera, E. Martínez-Quiroz, H. Berdejo, ., and M. Fernández, “General method for thickness determination of thin backed films. New formulation of backscattering spectrometry”, Rev. Mex. Fís., vol. 41, no. 4, pp. 507–523, Jan. 1994.

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