General method for thickness determination of thin backed films. New formulation of backscattering spectrometry

Authors

  • E.F. Aguilera
  • E. Martínez-Quiroz
  • H.M. Berdejo
  • .
  • M.C. Fernández

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Published

1994-01-01

How to Cite

[1]
E. Aguilera, E. Martínez-Quiroz, H. Berdejo, ., and M. Fernández, General method for thickness determination of thin backed films. New formulation of backscattering spectrometry, Rev. Mex. Fís. 41, (1994).

Issue

Vol. 41 No. 4 (1994): Revista Mexicana de Física.

Section

Articles

License

Authors retain copyright and grant the Revista Mexicana de Física right of first publication with the work simultaneously licensed under a CC BY-NC-ND 4.0 that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this journal.

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