Investigation of metal oxide semiconductor structures containing discrete interface traps

Authors

  • P. Pe
  • kov.
  • T. Díaz
  • .
  • H. Juárez

Downloads

Download data is not yet available.

Downloads

Published

1994-01-01

How to Cite

[1]
P. Pe, kov., T. Díaz, ., and H. Juárez, Investigation of metal oxide semiconductor structures containing discrete interface traps, Rev. Mex. Fís. 41, (1994).

Most read articles by the same author(s)

1 2 3 4 5 6 7 8 9 10 > >>