Surface and Structural characterization of Si¡-xGeX/Si alloys and multi-quantum wells Grown by Gas Source Molecular beam Epitaxy

Authors

  • L.-F. Zou
  • S.E. Acosta-Ortíz
  • L.E. Regalado
  • LuXin Zou.
  • J. Sarabia-Torres
  • .
  • G.A. Pérez-Herrera

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Published

2000-01-01

How to Cite

[1]
L.-F. Zou, “Surface and Structural characterization of Si¡-xGeX/Si alloys and multi-quantum wells Grown by Gas Source Molecular beam Epitaxy”, Rev. Mex. Fís., vol. 46, no. 5, pp. 415–418, Jan. 2000.

Issue

Vol. 46 No. 5 (2000): Revista Mexicana de Física.

Section

Articles

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Authors retain copyright and grant the Revista Mexicana de Física right of first publication with the work simultaneously licensed under a CC BY-NC-ND 4.0 that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this journal.