Simultaneous measure of refractive index and thickness of dielectric plane parallel plates by fringe counting:\ a case for generalized regression

Authors

  • G. Rodriguez-Zurita
  • R. Pastrana-Sanchez
  • .
  • J. Vazquez-Castillo

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Published

1999-01-01

How to Cite

[1]
G. Rodriguez-Zurita, R. Pastrana-Sanchez, ., and J. Vazquez-Castillo, “Simultaneous measure of refractive index and thickness of dielectric plane parallel plates by fringe counting:\ a case for generalized regression”, Rev. Mex. Fís., vol. 45, no. 5, pp. 490–495, Jan. 1999.

Issue

Vol. 45 No. 5 (1999): Revista Mexicana de Física.

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Articles

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Authors retain copyright and grant the Revista Mexicana de Física right of first publication with the work simultaneously licensed under a CC BY-NC-ND 4.0 that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this journal.