Simultaneous measure of refractive index and thickness of dielectric plane parallel plates by fringe counting:\ a case for generalized regression

Authors

  • G. Rodriguez-Zurita
  • R. Pastrana-Sanchez
  • .
  • J. Vazquez-Castillo

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Published

1999-01-01

How to Cite

[1]
G. Rodriguez-Zurita, R. Pastrana-Sanchez, ., and J. Vazquez-Castillo, Simultaneous measure of refractive index and thickness of dielectric plane parallel plates by fringe counting:\ a case for generalized regression, Rev. Mex. Fís. 45, (1999).

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