A program for phase identification using diffractograms obtained from TEM structure images

Authors

  • R. Galicia
  • R. Herrera
  • J. L
  • C. Zorrilla
  • A. Gómez

Keywords:

Electron microscopy, X-ray diffraction, difractograms, indexing

Abstract

In this work a computer program for the indexing of diffractograms is presented. The diffractograms are obtained by means of a discrete Fourier transform from high resolution electron microscope images. The program requires the use of x-ray diffraction data files together with a fast Fourier transform program, for this purpose we used the Digital Micrograph software.

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Published

2013-01-01

Issue

Vol. 59 No. 2 (2013): Revista Mexicana de Física.

Section

Articles

License

Authors retain copyright and grant the Revista Mexicana de Física right of first publication with the work simultaneously licensed under a CC BY-NC-ND 4.0 that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this journal.

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