Optical characterization of thin and ultrathin chromium films

Authors

  • J.M. Siqueiros
  • R. Machorro
  • Shu Wang.
  • L.E. Talavera
  • J. Portelles
  • .
  • F. Villa

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Published

1999-01-01

How to Cite

[1]
J. Siqueiros, “Optical characterization of thin and ultrathin chromium films”, Rev. Mex. Fís., vol. 45, no. 6, pp. 593–596, Jan. 1999.

Issue

Vol. 45 No. 6 (1999): Revista Mexicana de Física.

Section

Articles

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Authors retain copyright and grant the Revista Mexicana de Física right of first publication with the work simultaneously licensed under a CC BY-NC-ND 4.0 that allows others to share the work with an acknowledgement of the work's authorship and initial publication in this journal.